TY  - JOUR

T1  - A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride

JO  - Materials Characterization

UR  - https://eprints.whiterose.ac.uk/id/eprint/131350

UR  - https://doi.org/10.1016/j.matchar.2018.05.006

PY  - 2018/07/01

AU  - Baggott A

AU  - Mazaheri M

AU  - Zhou Y

AU  - Zhang H

AU  - Inkson BJ

ED  - 

DO  - DOI: 10.1016/j.matchar.2018.05.006

PB  - Elsevier

VL  - 141

SP  - 362

EP  - 369

Y2  - 2026/07/21

ER  -