@article{article, title  = {{Bilevel Cyber-Induced Overloads Mechanism for False Data Injection Attacks Considering Post-Attack Economic Dispatch}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://doi.org/10.1109/tifs.2026.3654445 }},

 year = {{2026}},

 month = {{1}},

 author = {{Du M and Zhang X and Zhang J and Bu S}},

 doi = {{10.1109/tifs.2026.3654445}},

 journal = {{IEEE Transactions on Information Forensics and Security}},

 pages = {{1-1}},

 note = {{Accessed on 2026/02/04}}}