TY  - JOUR

T1  - Bilevel Cyber-Induced Overloads Mechanism for False Data Injection Attacks Considering Post-Attack Economic Dispatch

JO  - IEEE Transactions on Information Forensics and Security

UR  - https://doi.org/10.1109/tifs.2026.3654445

PY  - 2026/01/19

AU  - Du M

AU  - Zhang X

AU  - Zhang J

AU  - Bu S

ED  - 

DO  - DOI: 10.1109/tifs.2026.3654445

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 21

SP  - 2918

EP  - 2932

Y2  - 2026/07/07

ER  -