TY  - CONF

T1  - Do automatic test generation tools generate flaky tests?

CY  - New York, NY, United States

JO  - ICSE '24: Proceedings of the 46th IEEE/ACM International Conference on Software Engineering

UR  - https://eprints.whiterose.ac.uk/id/eprint/203874

PY  - 2024/02/06

AU  - Gruber M

AU  - Roslan MF

AU  - Parry O

AU  - Scharnböck F

AU  - McMinn P

AU  - Fraser G

ED  - 

DO  - DOI: 10.1145/3597503.3608138

PB  - Association for Computing Machinery (ACM)

SN  - 9798400702174

Y2  - 2025/11/29

ER  -