TY  - JOUR

T1  - X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) analysis of UV‐exposed polystyrene

JO  - Macromolecular Chemistry and Physics

UR  - https://doi.org/10.1002/macp.1995.021961122

PY  - 2003/03/12

AU  - France RM

AU  - O'Toole L

AU  - Short RD

AU  - Pollicino N

ED  - 

DO  - DOI: 10.1002/macp.1995.021961122

PB  - Wiley

VL  - 196

IS  - 11

SP  - 3695

EP  - 3705

Y2  - 2025/11/30

ER  -