TY  - CONF

T1  - Generation of Misfit Dislocations in Highly Mismatched GaN/AlN Layers

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2007

PY  - 2008/01/01

AU  - Bai J

AU  - Wang T

AU  - Parbrook PJ

AU  - Lee KB

AU  - Wang Q

AU  - Cullis AG

ED  - Cullis AG

ED  - Midgley PA

VL  - 120

SP  - 33

EP  - 36

Y2  - 2025/05/18

ER  -