TY  - CONF

T1  - Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs

JO  - 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)

UR  - https://doi.org/10.1109/relphy.2000.843899

PY  - 2000/01/01

AU  - Manhas SK

AU  - de Souza MM

AU  - Gates AS

AU  - Chetlur SC

AU  - Sankara Narayanan EM

ED  - 

DO  - DOI: 10.1109/relphy.2000.843899

PB  - IEEE

SP  - 108

EP  - 111

Y2  - 2025/11/24

ER  -