TY  - JOUR

T1  - Explainable AI-Driven Quality and Condition Monitoring in Smart Manufacturing

JO  - Sensors

UR  - https://www.mdpi.com/1424-8220/26/3/911

PY  - 2026/01/30

AU  - Sivanathan A

AU  - Ahangar M

AU  - Farhat Z

AU  - Nilanesan K

AU  - Kaur S

ED  - 

DO  - DOI: 10.3390/s26030911

Y2  - 2026/02/17

ER  -