TY  - JOUR

T1  - Atomic force microscopy analysis of cleaved facets in III-nitride laser diodes grown on free-standing GaN substrates

JO  - Applied Physics Letters

UR  - https://doi.org/10.1063/1.2167400

PY  - 2006/01/25

AU  - Smeeton TM

AU  - Bousquet V

AU  - Hooper SE

AU  - Kauer M

AU  - Heffernan J

ED  - 

DO  - DOI: 10.1063/1.2167400

PB  - AIP Publishing

VL  - 88

IS  - 4

Y2  - 2025/11/25

ER  -