TY  - JOUR

T1  - Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

JO  - physica status solidi (c)

UR  - https://eprints.whiterose.ac.uk/id/eprint/86361

UR  - http://dx.doi.org/10.1002/pssc.201400121

PY  - 2015/02/27

AU  - Walther T

ED  - 

DO  - DOI: 10.1002/pssc.201400121

PB  - John Wiley & Sons

VL  - 12

IS  - 3

SP  - 310

EP  - 313

Y2  - 2025/12/01

ER  -