TY  - JOUR

T1  - Measurement and characterisation technique for real-time die temperature prediction of MOSFET-based power electronics

JO  - IEEE Transactions on Power Electronics

UR  - https://eprints.whiterose.ac.uk/id/eprint/90214

UR  - http://dx.doi.org/10.1109/TPEL.2015.2476557

PY  - 2015/09/03

AU  - Davidson J

AU  - Stone D

AU  - Foster M

AU  - Gladwin D

ED  - 

DO  - DOI: 10.1109/TPEL.2015.2476557

PB  - IEEE

Y2  - 2025/11/01

ER  -