TY  - CONF

T1  - Input-output conformance testing based on featured transition systems

JO  - Proceedings of the 29th Annual ACM Symposium on Applied Computing

UR  - https://doi.org/10.1145/2554850.2554949

PY  - 2014/03/24

AU  - Beohar H

AU  - Mousavi MR

ED  - 

DO  - DOI: 10.1145/2554850.2554949

PB  - ACM

SP  - 1272

EP  - 1278

Y2  - 2025/11/20

ER  -