TY  - CONF

T1  - Hot-carrier injection in step-drift RF power LDMOSFET

JO  - 2004 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS

PY  - 2004/07/12

AU  - Cao G

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/RELPHY.2004.1315338

SP  - 283

EP  - 287

Y2  - 2025/11/13

ER  -