TY  - CONF

T1  - Beyond test flakiness: a manifesto for a holistic approach to test suite health

JO  - 2025 IEEE/ACM International Flaky Tests Workshop (FTW)

UR  - https://eprints.whiterose.ac.uk/id/eprint/223068

PY  - 2025/07/02

AU  - McMinn P

AU  - Roslan MF

AU  - Kapfhammer GM

ED  - 

DO  - DOI: 10.1109/FTW66604.2025.00007

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 979-8-3315-0232-4

Y2  - 2025/11/29

ER  -