TY  - JOUR

T1  - Measurements of low-frequency noise in thick film resistors

JO  - Thin Solid Films

UR  - https://doi.org/10.1016/0040-6090(71)90107-6

PY  - 1971/09/01

AU  - Hawkins RJ

AU  - Bloodworth GG

ED  - 

DO  - DOI: 10.1016/0040-6090(71)90107-6

PB  - Elsevier BV

VL  - 8

IS  - 3

SP  - 193

EP  - 197

Y2  - 2026/02/04

ER  -