TY  - JOUR

T1  - A new method of high resolution, quantitative phase scanning microscopy

JO  - Proceedings of SPIE the International Society for Optical Engineering

PY  - 2010/06/02

AU  - Maiden AM

AU  - Rodenburg JM

AU  - Humphry MJ

ED  - 

DO  - DOI: 10.1117/12.853339

VL  - 7729

Y2  - 2025/12/01

ER  -