TY  - JOUR

T1  - High-Frequency Injection-Based Inter-Turn Short-Circuit Fault Detection in SPM Machines Considering Current Closed-Loop Control Effect

JO  - IEEE transactions on industrial electronics (1982. Print)

PY  - 2026/07/23

AU  - Li G-J

ED  - 

PB  - Institute of Electrical and Electronics Engineers

Y2  - 2026/08/02

ER  -