TY  - CONF

T1  - Experimental Study of the Impact of SO Phonon Scattering in High-K Gate Dielectric MOSFETs

JO  - ECS Meeting Abstracts

UR  - https://doi.org/10.1149/ma2006-02/22/1088

PY  - 2006/01/01

AU  - Atarah S

AU  - De Souza MM

AU  - Atarah S

ED  - 

DO  - DOI: 10.1149/ma2006-02/22/1088

PB  - The Electrochemical Society

VL  - MA2006-02

IS  - 22

SP  - 1088

EP  - 1088

Y2  - 2025/12/07

ER  -