TY  - JOUR

T1  - Explainable AI-driven quality and condition monitoring in smart manufacturing

JO  - Sensors

UR  - https://eprints.whiterose.ac.uk/id/eprint/237260

PY  - 2026/01/30

AU  - Ahangar M

AU  - Farhat Z

AU  - Sivanathan A

AU  - Nilanesan K

AU  - Ketheesram N

AU  - Kaur S

ED  - 

DO  - DOI: 10.3390/s26030911

PB  - MDPI AG

VL  - 26

IS  - 3

Y2  - 2026/02/17

ER  -