TY  - JOUR

T1  - Analytical modeling of sheet carrier density and ON-resistance in Polarization Super-Junction HFETs

JO  - IEEE Transactions on Electron Devices

UR  - https://eprints.whiterose.ac.uk/id/eprint/178389

PY  - 2021/10/01

AU  - Yan H

AU  - Du Y

AU  - Luo P

AU  - Tan X

AU  - Madathil S

ED  - 

DO  - DOI: 10.1109/TED.2021.3115091

PB  - Institute of Electrical and Electronics Engineers

VL  - 68

IS  - 11

SP  - 5714

EP  - 5719

Y2  - 2025/11/24

ER  -