TY  - JOUR

T1  - New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy

JO  - Journal of Microscopy

UR  - https://eprints.whiterose.ac.uk/id/eprint/91474

UR  - https://dx.doi.org/10.1111/jmi.12345

PY  - 2015/11/02

AU  - Parri MC

AU  - Qiu Y

AU  - Walther T

ED  - 

DO  - DOI: 10.1111/jmi.12345

PB  - Wiley

VL  - 260

IS  - 3

SP  - 427

EP  - 441

Y2  - 2025/12/01

ER  -