TY  - JOUR

T1  - Weibull-Fréchet random path length model for avalanche gain and noise in photodiodes

JO  - Journal of Physics D: Applied Physics

UR  - https://doi.org/10.1088/1361-6463/ac31f0

PY  - 2021/11/02

AU  - Ong DS

AU  - Tan AH

AU  - Choo KY

AU  - Yeoh KH

AU  - David JPR

ED  - 

DO  - DOI: 10.1088/1361-6463/ac31f0

PB  - IOP Publishing

VL  - 55

IS  - 6

SP  - 065105

EP  - 065105

Y2  - 2025/11/19

ER  -