@article{article, title  = {{Scanning tunneling microscope study of defect structures on As-terminated Si(001) surfaces}},

 publisher = {{American Vacuum Society}},

 url = {{https://doi.org/10.1116/1.588872 }},

 year = {{1996}},

 month = {{7}},

 author = {{Jackson MD and Leibsle FM and Cole RJ and Gregory DAC and Woolf DA and Weightman P}},

 doi = {{10.1116/1.588872}},

 volume = {{14}},

 journal = {{Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena}},

 issue = {{4}},

 pages = {{2424-2427}},

 note = {{Accessed on 2026/02/04}}}