TY  - JOUR

T1  - Scanning tunneling microscope study of defect structures on As-terminated Si(001) surfaces

JO  - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

UR  - https://doi.org/10.1116/1.588872

PY  - 1996/07/01

AU  - Jackson MD

AU  - Leibsle FM

AU  - Cole RJ

AU  - Gregory DAC

AU  - Woolf DA

AU  - Weightman P

ED  - 

DO  - DOI: 10.1116/1.588872

PB  - American Vacuum Society

VL  - 14

IS  - 4

SP  - 2424

EP  - 2427

Y2  - 2026/02/04

ER  -