TY  - JOUR

T1  - Precision enhancement in boundary element methods with application to electron optics.

JO  - Microscopy (Oxf)

PY  - 2016/04/10

AU  - Loyd JS

AU  - Gregory DA

ED  - 

DO  - DOI: 10.1093/jmicro/dfw012

VL  - 65

IS  - 4

SP  - 325

EP  - 336

Y2  - 2026/02/04

ER  -