TY  - JOUR

T1  - An effective zero-shot learning approach for intelligent fault detection using 1D CNN

JO  - Applied Intelligence

UR  - https://eprints.whiterose.ac.uk/id/eprint/193658

PY  - 2022/12/01

AU  - Zhang S

AU  - Wei H

AU  - Ding J

ED  - 

DO  - DOI: 10.1007/s10489-022-04342-1

PB  - Springer

VL  - 53

IS  - 12

SP  - 16041

EP  - 16058

Y2  - 2025/10/31

ER  -