TY  - CONF

T1  - High-k gate dielectric MOSFETs: Meeting the challenges of characterization and modeling

JO  - Ecs Transactions

PY  - 2011/04/25

AU  - De Souza MM

AU  - Sicre SBF

AU  - Casterman D

ED  - 

DO  - DOI: 10.1149/1.3572305

VL  - 35

IS  - 4

SP  - 563

EP  - 580

Y2  - 2025/12/07

ER  -