TY  - JOUR

T1  - Optimizing the length of checking sequences

JO  - IEEE Transactions on Computers

UR  - https://doi.org/10.1109/tc.2006.80

PY  - 2006/05/01

AU  - Hierons RM

AU  - Ural H

ED  - 

DO  - DOI: 10.1109/tc.2006.80

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 55

IS  - 5

SP  - 618

EP  - 629

Y2  - 2025/11/05

ER  -