TY  - JOUR

T1  - Evaluation of dynamic avalanche performance in 1.2kV MOS-bipolar devices

JO  - IEEE Transactions on Electron Devices

UR  - https://eprints.whiterose.ac.uk/id/eprint/162876

PY  - 2020/09/01

AU  - Luo P

AU  - Madathil S

AU  - Nishizawa S

AU  - Saito W

ED  - 

DO  - DOI: 10.1109/TED.2020.3007594

PB  - Institute of Electrical and Electronics Engineers

VL  - 67

IS  - 9

SP  - 3691

EP  - 3697

Y2  - 2025/11/24

ER  -