@inproceedings{inproceedings, title  = {{Exploring pseudo-testedness: empirically evaluating extreme mutation testing at the statement level}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/216881 }},

 year = {{2024}},

 month = {{12}},

 author = {{Maton M and Kapfhammer G and McMinn P}},

 doi = {{10.1109/ICSME58944.2024.00059}},

 isbn = {{979-8-3503-9569-3}},

 journal = {{2024 IEEE International Conference on Software Maintenance and Evolution (ICSME)}},

 pages = {{587-598}},

 note = {{Accessed on 2025/12/07}}}