TY  - CONF

T1  - Exploring pseudo-testedness: empirically evaluating extreme mutation testing at the statement level

JO  - 2024 IEEE International Conference on Software Maintenance and Evolution (ICSME)

UR  - https://eprints.whiterose.ac.uk/id/eprint/216881

PY  - 2024/12/19

AU  - Maton M

AU  - Kapfhammer G

AU  - McMinn P

ED  - 

DO  - DOI: 10.1109/ICSME58944.2024.00059

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 979-8-3503-9569-3

SP  - 587

EP  - 598

Y2  - 2025/11/29

ER  -