@inbook{inbook, title  = {{Automated EELS Core-Loss Edge Detection for Quantification of the Chemical Composition of Nano-Structured Semiconductors}},

 publisher = {{Elsevier}},

 url = {{https://doi.org/10.1016/b978-0-12-819728-8.00007-3 }},

 year = {{2021}},

 month = {{6}},

 author = {{Angadi VC and Abhayaratne C and Walther T}},

 doi = {{10.1016/b978-0-12-819728-8.00007-3}},

 isbn = {{9780128197356}},

 pages = {{605-618}},

 note = {{Accessed on 2025/11/01}}}