TY  - CHAP

T1  - Automated EELS Core-Loss Edge Detection for Quantification of the Chemical Composition of Nano-Structured Semiconductors

T2  - Encyclopedia of Materials: Electronics

UR  - https://doi.org/10.1016/b978-0-12-819728-8.00007-3

PY  - 2021/06/30

AU  - Angadi VC

AU  - Abhayaratne C

AU  - Walther T

ED  - 

DO  - DOI: 10.1016/b978-0-12-819728-8.00007-3

PB  - Elsevier

SN  - 9780128197356

SP  - 605

EP  - 618

Y2  - 2025/11/01

ER  -