TY  - JOUR

T1  - Avalanche breakdown timing statistics for silicon single photon avalanche diodes

JO  - IEEE Journal of Selected Topics in Quantum Electronics

UR  - https://eprints.whiterose.ac.uk/id/eprint/125653

PY  - 2017/12/04

AU  - Petticrew JD

AU  - Dimler SJ

AU  - Zhou X

AU  - Morrison AP

AU  - Tan CH

AU  - Ng JS

ED  - 

DO  - DOI: 10.1109/JSTQE.2017.2779834

PB  - Institute of Electrical and Electronics Engineers

VL  - 24

IS  - 2

Y2  - 2025/11/19

ER  -