TY  - JOUR

T1  - Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir<sub>0.2</sub>Mn<sub>0.8</sub> Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

JO  - Microscopy and Microanalysis

UR  - https://doi.org/10.1017/s1431927610056515

PY  - 2010/08/01

AU  - Kohn A

AU  - Kovacs A

AU  - Wang S-G

AU  - Wang C

AU  - Dean J

AU  - Schrefl T

AU  - Zeltser A

AU  - Carey MJ

AU  - Petford-Long AK

AU  - C Ward RC

ED  - 

DO  - DOI: 10.1017/s1431927610056515

PB  - Oxford University Press (OUP)

VL  - 16

IS  - S2

SP  - 1914

EP  - 1915

Y2  - 2025/11/25

ER  -