TY  - JOUR

T1  - A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

JO  - Review of Scientific Instruments

UR  - https://eprints.whiterose.ac.uk/id/eprint/106359

UR  - https://dx.doi.org/10.1063/1.4901221

PY  - 2014/11/01

AU  - Mullin N

AU  - Hobbs JK

ED  - 

DO  - DOI: 10.1063/1.4901221

PB  - AIP Publishing

VL  - 85

IS  - 11

Y2  - 2025/12/04

ER  -