TY  - CONF

T1  - Log-based slicing for system-level test cases

JO  - Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis

UR  - https://doi.org/10.1145/3460319.3464824

PY  - 2021/07/11

AU  - Messaoudi S

AU  - Shin D

AU  - Panichella A

AU  - Bianculli D

AU  - Briand LC

ED  - 

DO  - DOI: 10.1145/3460319.3464824

PB  - ACM

SP  - 517

EP  - 528

Y2  - 2025/11/28

ER  -