@article{article, title  = {{Improving test quality using robust unique input/output circuit sequences (UIOCs)}},

 publisher = {{Elsevier BV}},

 url = {{https://doi.org/10.1016/j.infsof.2005.08.001 }},

 year = {{2006}},

 month = {{8}},

 author = {{Guo Q and Hierons RM and Harman M and Derderian K}},

 doi = {{10.1016/j.infsof.2005.08.001}},

 volume = {{48}},

 journal = {{Information and Software Technology}},

 issue = {{8}},

 pages = {{696-707}},

 note = {{Accessed on 2025/11/05}}}