@article{article, title  = {{Bounded reordering in the distributed test architecture}},

 publisher = {{IEEE}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/142295 https://doi.org/10.1109/TR.2018.2800093 }},

 year = {{2018}},

 month = {{6}},

 author = {{Hierons RM and Merayo MG and Nunez M}},

 doi = {{10.1109/TR.2018.2800093}},

 volume = {{67}},

 journal = {{IEEE Transactions on Reliability}},

 issue = {{2}},

 pages = {{522-537}},

 note = {{Accessed on 2025/11/18}}}