TY  - JOUR

T1  - Bounded reordering in the distributed test architecture

JO  - IEEE Transactions on Reliability

UR  - https://eprints.whiterose.ac.uk/id/eprint/142295

UR  - https://doi.org/10.1109/TR.2018.2800093

PY  - 2018/06/01

AU  - Hierons RM

AU  - Merayo MG

AU  - Nunez M

ED  - 

DO  - DOI: 10.1109/TR.2018.2800093

PB  - IEEE

VL  - 67

IS  - 2

SP  - 522

EP  - 537

Y2  - 2025/11/05

ER  -