TY  - JOUR

T1  - Mapping nanostructural variations in silk by secondary electron hyperspectral imaging

JO  - Advanced Materials

UR  - https://eprints.whiterose.ac.uk/id/eprint/122497

PY  - 2017/12/14

AU  - Wan Q

AU  - Abrams K

AU  - Masters R

AU  - Talari ACS

AU  - Rehman IU

AU  - Claeyssens F

AU  - Holland C

AU  - Rodenburg C

ED  - 

DO  - DOI: 10.1002/adma.201703510

PB  - Wiley

VL  - 29

IS  - 47

Y2  - 2025/11/03

ER  -