TY  - JOUR

T1  - Two components of 1/ƒ noise in mos transistors

JO  - Solid-State Electronics

UR  - https://doi.org/10.1016/0038-1101(71)90160-2

PY  - 1971/10/01

AU  - Hawkins RJ

AU  - Bloodworth GG

ED  - 

DO  - DOI: 10.1016/0038-1101(71)90160-2

PB  - Elsevier BV

VL  - 14

IS  - 10

SP  - 929

EP  - 932

Y2  - 2026/02/04

ER  -