@inproceedings{inproceedings, title  = {{STICCER: Fast and effective database test suite reduction through merging of similar test cases}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/230097 }},

 year = {{2020}},

 month = {{8}},

 author = {{Alsharif A and Kapfhammer GM and McMinn P}},

 doi = {{10.1109/icst46399.2020.00031}},

 isbn = {{9781728157795}},

 journal = {{2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)}},

 pages = {{220-230}},

 note = {{Accessed on 2025/11/29}}}