TY  - CONF

T1  - STICCER: Fast and effective database test suite reduction through merging of similar test cases

JO  - 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)

UR  - https://eprints.whiterose.ac.uk/id/eprint/230097

PY  - 2020/08/05

AU  - Alsharif A

AU  - Kapfhammer GM

AU  - McMinn P

ED  - 

DO  - DOI: 10.1109/icst46399.2020.00031

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 9781728157795

SP  - 220

EP  - 230

Y2  - 2025/11/29

ER  -