TY  - CONF

T1  - An illustration of new methods in machine condition monitoring, Part I: Stochastic resonance

JO  - Journal of Physics: Conference Series

UR  - https://eprints.whiterose.ac.uk/id/eprint/119167

UR  - https://doi.org/10.1088/1742-6596/842/1/012058

PY  - 2017/06/02

AU  - Worden K

AU  - Antoniadou I

AU  - Marchesiello S

AU  - Mba C

AU  - Garibaldi L

ED  - 

DO  - DOI: 10.1088/1742-6596/842/1/012058

PB  - IOP Publishing

VL  - 842

IS  - 1

Y2  - 2025/11/23

ER  -