TY  - JOUR

T1  - A Practical Guide to Optical Metrology for Thin Films, by Michael Quinten

JO  - Contemporary Physics

UR  - https://doi.org/10.1080/00107514.2013.835351

PY  - 2013/09/01

AU  - Fox M

ED  - 

DO  - DOI: 10.1080/00107514.2013.835351

PB  - Informa UK Limited

VL  - 54

IS  - 5

SP  - 255

EP  - 255

Y2  - 2025/11/29

ER  -