TY  - CONF

T1  - Automatic Test Data Generation for Multiple Condition and MCDC Coverage

JO  - 2009 Fourth International Conference on Software Engineering Advances

UR  - https://doi.org/10.1109/icsea.2009.31

PY  - 2009/12/03

AU  - Ghani K

AU  - Clark JA

ED  - 

DO  - DOI: 10.1109/icsea.2009.31

PB  - IEEE

SP  - 152

EP  - 157

Y2  - 2025/11/04

ER  -