TY  - GEN

T1  - Diode Area Melting of Ti6Al4V: Effects of Multi-Laser Processing on Microstructure and Residual Stress

T2  - Springer Science and Business Media LLC

UR  - https://doi.org/10.21203/rs.3.rs-9968290/v1

PY  - 2026/06/25

AU  - Liang A

AU  - Veetil S

AU  - Groom K

AU  - Mumtaz K

ED  - 

DO  - DOI: 10.21203/rs.3.rs-9968290/v1

Y2  - 2026/07/21

ER  -