TY  - GEN

T1  - Validating x-ray line-profile defect analysis using atomistic models of deformed material

T2  - arXiv

PY  - 2022/03/25

AU  - Race CP

AU  - Ungar T

AU  - Ribarik G

ED  - 

DO  - DOI: 10.48550/arxiv.2203.13643

Y2  - 2026/05/13

ER  -