@article{article, title  = {{Metal-induced trap states: the roles of interface and border traps in HfO2/InGaAs}},

 publisher = {{MDPI AG}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/203251 }},

 year = {{2023}},

 month = {{8}},

 author = {{Do H-B and Luc Q-H and Pham PV and Phan-Gia A-V and Nguyen T-S and Le H-M and De Souza MM}},

 doi = {{10.3390/mi14081606}},

 volume = {{14}},

 journal = {{Micromachines}},

 issue = {{8}},

 note = {{Accessed on 2025/12/07}}}